Microscope for force and tunneling microscopy in liquids

Details Microscope for force and tunneling microscopy in liquids Microscope for force and tunneling microscopy in liquids

1995-06-07

1997-04-15

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

250307, 73105, H01J 3720

Patent

active

056212100

ABSTRACT:
An instrument for carrying out both scanning tunneling microscopy and atomic force microscopy on the same sample under liquid. A microscope body with a magnetically-suspended sample platen permits both the force-sensing probe and the tunneling tip to be scanned from above the sample, dipping into a liquid cell. The same area of the sample may be scanned by both probes in turn by translating the sample platen that it is under the desired probe. Atomic force microscopy may be carried out on the part of the sample of interest, the sample translated so that the tunneling tip is over the same area and the sample advanced so as to bring the tunneling probe into tunneling range, and a scanning tunneling microscope image obtained.

REFERENCES:
patent: Re33387 (1990-10-01), Binnig
patent: Re34331 (1993-08-01), Elings et al.
patent: Re34489 (1993-12-01), Hansma et al.
patent: 4343993 (1982-08-01), Binnig et al.
patent: 4785177 (1988-11-01), Besocke
patent: 4800274 (1989-01-01), Hansma et al.
patent: 4806755 (1989-02-01), Duerig et al.
patent: 4866271 (1989-09-01), Ono et al.
patent: 4868396 (1989-09-01), Lindsay
patent: 4871938 (1989-10-01), Elings et al.
patent: 4877957 (1989-10-01), Okada et al.
patent: 4914293 (1990-04-01), Hayashi et al.
patent: 4935634 (1990-06-01), Hansma et al.
patent: 4947042 (1990-08-01), Nishioka et al.
patent: 4969978 (1990-11-01), Tomita et al.
patent: 4992728 (1991-02-01), McCord et al.
patent: 5025658 (1991-06-01), Elings et al.
patent: 5047633 (1991-09-01), Finlan et al.
patent: 5077473 (1991-12-01), Elings et al.
patent: 5103095 (1992-04-01), Elings et al.
patent: 5107114 (1992-04-01), Nishioka et al.
patent: 5117110 (1992-05-01), Yasutake
patent: 5120959 (1992-06-01), Tomita
patent: 5142145 (1992-08-01), Yasutake
patent: 5144833 (1992-09-01), Amer et al.
patent: 5155361 (1992-10-01), Lindsay
patent: 5157251 (1992-10-01), Albrecht et al.
patent: 5168159 (1992-12-01), Yagi
patent: 5189906 (1993-03-01), Elings et al.
patent: 5200616 (1993-04-01), Kokawa et al.
patent: 5202004 (1993-04-01), Kwak et al.
patent: 5247186 (1993-09-01), Toda
patent: 5253516 (1993-10-01), Elings et al.
patent: 5260567 (1993-11-01), Kuroda et al.
patent: 5260824 (1993-11-01), Okada et al.
patent: 5266897 (1993-11-01), Watanuki et al.
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5276324 (1994-01-01), Ohtaki et al.
patent: 5289004 (1994-02-01), Okada et al.
patent: 5291775 (1994-03-01), Gamble et al.
patent: 5294804 (1994-03-01), Kajimura
patent: 5296704 (1994-03-01), Mishima et al.
patent: 5298975 (1994-03-01), Khoury et al.
patent: 5304924 (1994-04-01), Yamano et al.
patent: 5307693 (1994-05-01), Griffith et al.
patent: 5314254 (1994-05-01), Yashar et al.
patent: 5317153 (1994-05-01), Matsushiro et al.
patent: 5319960 (1994-06-01), Gamble et al.
patent: 5325010 (1994-06-01), Besocke et al.
patent: 5338932 (1994-08-01), Theodore et al.
patent: 5357105 (1994-10-01), Harp et al.
patent: 5360977 (1994-11-01), Onuki et al.
patent: 5363697 (1994-11-01), Nakagawa
patent: 5388452 (1995-02-01), Harp et al.
patent: 5461907 (1995-10-01), Tench et al.
patent: 5468959 (1995-11-01), Tohda et al.
patent: 5500535 (1996-03-01), Jing
patent: 5513518 (1996-05-01), Lindsay
patent: 5515719 (1996-05-01), Lindsay
S. Jarvis, et al., "A Novel Force Microscope and Point Contact Probe", Dec., 1993, Rev. Sci. Instrum., vol. 64, No. 12, pp.3515-3520.
A. Stewart, et al., "Use of Magnetic Forces to Control Distance in a Surface Force Apparatus", 1990, Meas. Sci. Technol., vol.1, pp. 1301-1303.
Hansma, et al., "Atomic force microscopy of DNA in aqueous solutions", Nucleic Acids Research, 1993, vol. 21, No. 3, pp. 505-512.
Lindsay, et al., "Scanning tunneling microscopy and atomic force microscopy studies of biomaterials at a liquid-solid interface", J. Vac. Sci. Technol., Jul./Aug. 1993, A., vol. 11, No. 4, pp. 808-815.
Lyubchenko, et al., "Atomic Force Microscopy Imaging of Double-Stranded DNA and RNA", Journal of Biomolecular Structure & Dynamics, 1992, vol. 10, Issue No. 3, pp. 589-606.
Lyubchenko, et al., "Atomic force microscopy of long DNA: Imaging in air and under water", Proc. Natl. Acad. Sci., Mar. 1993, vol. 90, pp. 2137-2140.
Nagahara, et al., "Preparation and characterization of STM tips for electrochemical studies", Rev. Sci. Instrum., Oct. 1989, 60 (10), pp. 3128-3130.
Ohnesorge, et al., "True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces", Science, Jun. 4, 1993, vol. 260, pp. 1451-1456.
Schueir, et al., "Creating and observing surface features with a Scanning Tunneling Microscope" SPIE, 1988, vol. 897, pp. 16-19.
Sonnenfeld, et al., "Atomic-resolution Microscopy in Water", Science, Apr. 11, 1986, vol. 232, pp. 211-213.
D.A. Grigg, et al., "Tip-sample forces in scanning probe microscopy in air and vacuum", Journal Vacuum Science Technology, Jul./Aug. 1992, pp. 680-683.
Hansma et al., "Atomic Force Microscope", Journal of Applied Physics, 76(2) Jul. 15, 1994, pp. 796-799.
Specht, et al., "Simultaneous measurement of tunneling current and force as a function of position through a lipid film on solid substrate", Surface Science Letters, Jul. 22, 1991, pp. L653-L658.
Jung, et al., "Novel Stationary-Sample Atomic Force Microscope with Beam-Tracking Lens", Electronic Letters, vol. 29, No. 3, Feb. 4, 1993, pp. 264-265.
Binnig, et al., "Single-tube three-dimensional scanner for scanning tunneling microscopy", Rev. Sci. Instrum. 57 (8), Aug. 1986, pp. 1688-1689.
Drake et al., "Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope", Science, vol. 243, Mar. 24, 1989, Reports, pp. 1586-1589.
Sonnenfeld, et al., "Atomic-Resolution Microscopy in Water", Reprint Series, Science, vol. 232, Apr. 11, 1986, pp. 211-213.
Davidsson et al., "A new symmetric scanning tunneling microscope design", Journal of Vacuum Science & Technology: Part A, Mar./Apr. 1988, No. 2, pp. 280-282.
Marti et al., "Atomic force microscopy of liquid-covered surfaces: Atomic resolution images", American Institute of Physics, Appl. Phys. Lett. 51(7), Aug. 17, 1987, pp. 484-486.
Kirk et al., "Low-temperature atomic force microscopy", Rev. Sci. Instru., 59 (6), Jun. 1988, pp. 833-835.
Sonnenfeld et al., "Semiconductor topography in aqueous environments: Tunneling microscopy of chemomechanically polished (001) GaAs", Appl. Phy. Lett. 50(24), Jun. 15, 1987. pp. 1742-1744.
Martin, et al., "Atomic force microscope-force mapping and profiling on a sub 100-.ANG.scale", J. Appl. Phys. 61 (10), May 15, 1987, pp. 4723-4729.
Travaglini et al., "Scanning Tunneling Microscopy on Biological Matter", Surface Science 181 (1987), pp. 380-391.
O'Shea et al., "Atomic force microscopy of local compliance at solid-liquid interfaces", Abstract, Cambridge University, pp. 1-13 (Date unknown, unpublished).
Putman et al., "Viscoelasticity of living cells allows high-resolution imaging by tapping mode atomic force microscopy", Department of Applied Physics, University of Twente, received Jan. 4, 1994 (unpublished).

Affiliated with

Also associated with

Rating

Microscope for force and tunneling microscopy in liquids does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microscope for force and tunneling microscopy in liquids, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microscope for force and tunneling microscopy in liquids will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-362668