Microscope apparatus for examining wafer

Details Microscope apparatus for examining wafer Microscope apparatus for examining wafer

1988-05-26

1989-05-23

Arnold, Bruce Y.

350521, 350530, 350531, 350532, 350320, G02B 2126, G02B 2132

Patent

active

048324744

ABSTRACT:
In order to substantially reduce the time required for examination and to enable the structure of the microscope apparatus for examining a wafer to be made in a compact size, the apparatus comprises a wafer examination unit provided midway on the transportation course of the wafer transporting means for being able to move the wafer under examination independently of the direction of its transporation, and an objective disposed above the wafer examination unit for being able to move along the upper face of the wafer which is held at the position of examination and in a direction different from the direction of the transportation.

REFERENCES:
patent: 3051026 (1962-08-01), DaCosta
patent: 3508835 (1970-04-01), Ware
patent: 3641648 (1972-02-01), Kalberman
patent: 4217977 (1980-01-01), Tam
patent: 4457419 (1984-01-01), Ogami et al.
patent: 4582191 (1986-04-01), Weigand
W. J. Alford et al., "Laser Scanning Microscopy", Proceedings of the IEEE, Vol. 70, No. 6, Jun. 1982, pp. 641-651.

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