Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate
2009-10-28
2011-11-15
Souw, Bernard E (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron probe type
C250S442110, C073S078000, C073S081000, C073S082000
Reexamination Certificate
active
08058613
ABSTRACT:
The present disclosure describes micromechanical devices and methods for using such devices for characterizing a material's strength. The micromechanical devices include an anchor pad, a top shuttle platform, a nanoindenter in movable contact with the top shuttle platform and at least two sample stage shuttles. The nanoindenter applies a compression force to the top shuttle platform, and the at least two sample stage shuttles move apart in response to the compression force. Each of the at least two sample stage shuttles is connected to the top shuttle platform and to the anchor pad by at least one inclined beam. Methods for using the devices include connecting a sample between the at least two sample stage shuttles and applying a compression force to the top shuttle platform. Application of the compression force to the top shuttle platform results in a tensile force being applied to the sample. Measuring a tip displacement of the nanoindenter is correlated with the sample's strength. Illustrative materials that can be studied using the micromechanical devices include, for example, nanotubes, nanowires, nanorings, nanocomposites and protein fibrils.
REFERENCES:
patent: 5157831 (1992-10-01), Wang et al.
patent: 6590212 (2003-07-01), Joseph et al.
patent: 6674077 (2004-01-01), Joseph et al.
patent: 7183548 (2007-02-01), Kley
patent: 7461543 (2008-12-01), Degertekin
patent: 7514680 (2009-04-01), Kley
patent: 7635844 (2009-12-01), Joseph et al.
patent: 7858936 (2010-12-01), Bray et al.
patent: 2007/0045537 (2007-03-01), Joseph et al.
patent: 2010/0279128 (2010-11-01), Lou et al.
Yu, et al., “Strength and Breaking Mechanism of Multiwalled Carbon Nanotubes Under Tensile Load”, Science, 287:2000, pp. 637-640.
Zhu, et al., “An electromechanical material testing system for in situ electron microscopy and applications”, Proc. Nat. Acad. Sci., 102:2005, pp. 14503-14508.
Ganesan Yogeeswaran
Lou Jun
Lu Yang
Peng Cheng
Souw Bernard E
William Marsh Rice University
Winstead PC
LandOfFree
Micromechanical devices for materials characterization does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Micromechanical devices for materials characterization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Micromechanical devices for materials characterization will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4288168