Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1998-02-09
2000-01-25
Larkin, Daniel S.
Measuring and testing
Surface and cutting edge testing
Roughness
G01B 734
Patent
active
060166932
ABSTRACT:
A sacrificial cantilever is used as a template for making cantilevers of non-standard materials for use in an atomic force microscope. The desired metal is deposited onto the sacrificial cantilever, followed by removal of the sacrificial cantilever.
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Chand Ami
Hansma Paul
Morrett Hal J.
Viani Mario B.
Wendman Mark A.
Larkin Daniel S.
The Regents of the University of California
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