Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2007-02-13
2007-02-13
Thai, Luan (Department: 2891)
Semiconductor device manufacturing: process
With measuring or testing
C438S018000
Reexamination Certificate
active
11014439
ABSTRACT:
A microelectronic package includes a microelectronic element having faces and contacts and a flexible substrate spaced from and overlying a first face of the microelectronic element. The package also includes a plurality of conductive posts extending from the flexible substrate and projecting away from the first face of the microelectronic element, wherein at least some of the conductive posts are electrically interconnected with the microelectronic element, and a plurality of support elements supporting the flexible substrate over the microelectronic element. The conductive posts are offset from the support elements to facilitate flexure of the substrate and movement of the posts relative to the microelectronic element.
REFERENCES:
patent: 4716049 (1987-12-01), Patraw
patent: 4804132 (1989-02-01), Difrancesco
patent: 4902600 (1990-02-01), Tamagawa et al.
patent: 4924353 (1990-05-01), Patraw
patent: 4975079 (1990-12-01), Beaman et al.
patent: 4982265 (1991-01-01), Watanabe et al.
patent: 5083697 (1992-01-01), Difrancesco
patent: 5138438 (1992-08-01), Masayuki et al.
patent: 5148265 (1992-09-01), Khandros et al.
patent: 5148266 (1992-09-01), Khandros et al.
patent: 5189505 (1993-02-01), Bartelink
patent: 5196726 (1993-03-01), Nishiguchi et al.
patent: 5214308 (1993-05-01), Nishiguchi et al.
patent: 5397997 (1995-03-01), Tuckerman et al.
patent: 5455390 (1995-10-01), DiStefano et al.
patent: 5518964 (1996-05-01), DiStefano et al.
patent: 5615824 (1997-04-01), Fjelstad et al.
patent: 5656550 (1997-08-01), Tsuji et al.
patent: 5659952 (1997-08-01), Kovac et al.
patent: 5679977 (1997-10-01), Khandros et al.
patent: 5731709 (1998-03-01), Pastore et al.
patent: 5802699 (1998-09-01), Fjelstad et al.
patent: 5811982 (1998-09-01), Beaman et al.
patent: 5854507 (1998-12-01), Miremadi et al.
patent: 5973391 (1999-10-01), Bischoff et al.
patent: 5980270 (1999-11-01), Fjelstad et al.
patent: 6032359 (2000-03-01), Carroll
patent: 6052287 (2000-04-01), Palmer et al.
patent: 6054756 (2000-04-01), DiStefano et al.
patent: 6177636 (2001-01-01), Fjelstad
patent: 6202297 (2001-03-01), Faraci et al.
patent: 6258625 (2001-07-01), Brofman et al.
patent: 6332270 (2001-12-01), Beaman et al.
patent: 6358627 (2002-03-01), Benenati et al.
patent: 6362525 (2002-03-01), Rahim
patent: 6458411 (2002-10-01), Goossen et al.
patent: 6495914 (2002-12-01), Sekine et al.
patent: 6514847 (2003-02-01), Ohsawa et al.
patent: 6515355 (2003-02-01), Jiang et al.
patent: 6522018 (2003-02-01), Tay et al.
patent: 6550666 (2003-04-01), Chew et al.
patent: 6555918 (2003-04-01), Masuda et al.
patent: 6578754 (2003-06-01), Tung
patent: 6624653 (2003-09-01), Cram
patent: 6647310 (2003-11-01), Yi et al.
patent: 6902869 (2005-06-01), Appelt et al.
patent: 2002/0125571 (2002-09-01), Corisis et al.
patent: 2002/0153602 (2002-10-01), Tay et al.
patent: 2003/0164540 (2003-09-01), Lee et al.
patent: 62-68015 (1994-09-01), None
North Corporation, “Processed Intra-layer Interconnection Material for PWBs [Etched Copper Bump with Copper Foil],” NMBI™, Version 2001.6.
Neo-Manhattan Technology, A Novel HDI Manufacturing Process, “High-Density Interconnects for Advanced Flex Substrates & 3-D Package Stacking,”IPC Flex & Chips Symposium, Tempe, AZ, Feb. 11-12, 2003.
Beroz Masud
Green Ronald
Haba Belgacem
Kubota Yoichi
Mohammed Ilyas
Lerner David Littenberg Krumholz & Mentlik LLP
Tessera Inc.
Thai Luan
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