Microelectronic devices having intermediate contacts for...

Active solid-state devices (e.g. – transistors – solid-state diode – Encapsulated

Reexamination Certificate

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C257S738000, C257SE23021, C257SE23069, C257SE21508, C257S678000, C257S679000, C257S680000, C257S690000, C257S730000, C257S733000, C257SE23001, C257SE23194, C257S091000, C257S177000, C257S182000

Reexamination Certificate

active

07745944

ABSTRACT:
Microelectronic devices having intermediate contacts, and associated methods of packaging microelectronic devices with intermediate contacts, are disclosed herein. A packaged microelectronic device configured in accordance with one embodiment of the invention includes a microelectronic die attached to an interconnecting substrate. The microelectronic die includes an integrated circuit electrically coupled to a plurality of terminals. Each of the terminals is electrically coupled to a corresponding first contact on the die with an individual wire-bond. Each of the first contacts on the die is electrically coupled to a corresponding second contact on the interconnecting substrate by a conductive coupler such as a solder ball.

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