Microcontroller test circuit

Details Microcontroller test circuit Microcontroller test circuit

1995-12-15

1999-09-07

Beausoliel, Jr., Robert W.

Excavating

307 39, G06F 1100

Patent

active

059497971

ABSTRACT:
A microcontroller test circuit having a plurality of pins includes first circuit for determining whether the microcontroller is in a normal mode or a test mode by sensing the potential of an input test signal; and second circuit for selectively opening a first path for making a first pin of the plurality of pins a signal output pin when the input signal is at a first potential and for opening a second path for making the first pin a test signal input pin when the input signal is at a second potential. In this way, the test circuit uses an existing pin that would not otherwise be used during testing instead of requiring a separate test pin.

REFERENCES:
patent: 4833395 (1989-05-01), Sasaki et al.
patent: 4837505 (1989-06-01), Mitsunobu
patent: 4970727 (1990-11-01), Miyawaki et al.
patent: 5266894 (1993-11-01), Takagi et al.
patent: 5384741 (1995-01-01), Haraguchi et al.
patent: 5402063 (1995-03-01), Kim
patent: 5410247 (1995-04-01), Ishizuka
patent: 5420869 (1995-05-01), Hatakeyama

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