Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-12-27
2005-12-27
Iqbal, Nadeem (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S030000, C714S031000, C714S042000, C713S002000
Reexamination Certificate
active
06981179
ABSTRACT:
When a built-in nonvolatile memory in a microcomputer is tested, a control program prestored in a boot ROM is run upon entering a test command from an external communication device; a test program is transferred from the external communication device to a built-in RAM through a communication circuit; a control of a CPU is switched to the built-in RAM after the test program has been transferred and a test is conducted on the nonvolatile memory; and a test result and a fail log are transferred to the external communication device through the communication circuit. Consequently, the built-in nonvolatile memory in the microcomputer can be checked without leaving the test program on the chip.
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Shigemasa Haruhiko
Shimoyama Nobuhiro
Takeda Tadao
Tanno Masaaki
Yaegawa Kazuhiro
Birch & Stewart Kolasch & Birch, LLP
Iqbal Nadeem
Nippon Telegraph and Telephone Corporation
Puente Emerson
Sharp Kabushiki Kaisha
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