Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate
2005-10-12
2009-02-17
Luu, Chuong A. (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Physical deformation
C257S050000, C257S052000, C257S774000
Reexamination Certificate
active
07492020
ABSTRACT:
A micro structure has: a semiconductor substrate; an insulating film having a via hole and formed on the semiconductor substrate; an interlock structure formed on a side wall of the via hole and having a retracted portion and a protruded portion above the retracted portion; a conductive member having at one end a connection portion formed burying the via hole and an extension portion continuous with the connection portion and extending along a direction parallel to a surface of the semiconductor substrate.
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Biebl, M., et al.; “In Situ Phosphorus-Doped Polysilicon for Integrated MEMS”; The 8th International Conference on Solid-State Sensors and Actuators, and Eurosensors IX; Stockholm, Sweden; Jun. 25-29, 1995; pp. 196-201.
Esasi, Masayosi,; “Micro Machine”; Industrial Technology Information Service Center Ltd., pp. 55-56.
Dickstein & Shapiro LLP
Luu Chuong A.
Yamaha Corporation
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