Micro ROM testing system using micro ROM timing circuitry for te

Details Micro ROM testing system using micro ROM timing circuitry for te Micro ROM testing system using micro ROM timing circuitry for te

1996-12-03

1998-08-11

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

371 222, 371 223, G11C 700

Patent

active

057936870

ABSTRACT:
Micro ROM testing is provided using timing logic and clocks utilized in normal operation of the micro ROM. A PLA in the micro ROM has its output lines coupled to read amplifiers that receive values read from the PLA locations selected by address inputs. The read amplifiers latch the PLA values into timing generators to produce timing signals of various types supplied to a microcontroller associated with the micro ROM. A test signal is supplied to the timing generators to disconnect them from the outputs of the read amplifiers and to establish a scan chain composed of the timing generators connected in series. Non-overlapping clock signals supplied by a system clock of the microcontroller cause the latched PLA values to shift through the timing generators in the scan chain. At a scan output of the last timing generator in the scan chain, the PLA values are observed and compared with the values expected from the selected PLA locations.

REFERENCES:
patent: 3958110 (1976-05-01), Hong et al.
patent: 4490783 (1984-12-01), McDonough et al.
patent: 4495629 (1985-01-01), Zasio et al.
patent: 4768196 (1988-08-01), Jou et al.
patent: 4855669 (1989-08-01), Mahoney
patent: 4860290 (1989-08-01), Daniels et al.
patent: 5047710 (1991-09-01), Mahoney
patent: 5206861 (1993-04-01), Hannon et al.
patent: 5210759 (1993-05-01), DeWitt et al.
patent: 5226149 (1993-07-01), Yoshida et al.
patent: 5252917 (1993-10-01), Kadowaki
patent: 5271019 (1993-12-01), Edwards et al.
patent: 5521865 (1996-05-01), Ohuchi et al.
patent: 5528601 (1996-06-01), Schmookler
patent: 5596584 (1997-01-01), Warren

Affiliated with

Also associated with

Rating

Micro ROM testing system using micro ROM timing circuitry for te does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Micro ROM testing system using micro ROM timing circuitry for te, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Micro ROM testing system using micro ROM timing circuitry for te will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-396416