Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2005-10-11
2005-10-11
Schillinger, Laura M (Department: 2813)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C438S693000, C438S694000, C430S005000, C378S035000, C378S034000
Reexamination Certificate
active
06953751
ABSTRACT:
A micro device comprising a SU-8 photoresist layer adhered to a thin layer of, for example, silicon nitride, silicon oxide, metal, and diamond. The SU-8 layer is clamped on the thin layer by using an under-etching technique.
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patent: 6821896 (2004-11-01), Shih
patent: 09205271 (1997-08-01), None
An article entitled, “SU-8 Thick Photoresist Processing . . . ,”, By Conradie et al., published by J. Micromech. Microeng., vol. 12, (2002), pp. 368-374.
An article entitled “Robust Parylene-To-Silicon Mechanical Anchoring”, By Liger et al., published by California Institute of Technology, (2003), pp. 602-605.
Akiyama Terunobu
Burri Mathieu
Detterbeck Manfred
Hartmann Theo
Lutter Stefan
Bachman & LaPointe P.C.
NanoWorld AG
Schillinger Laura M
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