Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate
2007-05-01
2011-11-08
Cohen Johnson, Amy (Department: 2841)
Geometrical instruments
Gauge
Movable contact probe, per se
C033S503000, C033S556000
Reexamination Certificate
active
08051576
ABSTRACT:
An attitude arm mounted to a support arm is rotatable about a pivot. The attitude arm holds a stylus gauge, which generates a signal representing deflection of the stylus in a measurement direction as the stylus follows a surface of a workpiece rotated on a turntable. An attitude switching mechanism allows switching between a first stylus attitude generally aligned with the turntable spindle axis and a second stylus attitude generally aligned perpendicular to the turntable spindle axis. To enable alignment of the measurement direction with the spindle axis, first and second adjusters enable the stylus tip to be moved perpendicular to the spindle axis and the measurement direction when in the first and second stylus attitudes, respectively. An orientation mechanism is provided to rotate the measurement direction of the stylus. A stylus tilt mechanism is provided to tilt the stylus about a tilt axis parallel with the measurement direction.
REFERENCES:
patent: 3452273 (1969-06-01), Foster
patent: 3478436 (1969-11-01), Barnes
patent: 3509635 (1970-05-01), Meinke
patent: 3531868 (1970-10-01), Stevenson
patent: 3678584 (1972-07-01), Dolan
patent: 4288925 (1981-09-01), McMurtry
patent: 4523382 (1985-06-01), Werner et al.
patent: 4807152 (1989-02-01), Lane et al.
patent: 5189806 (1993-03-01), McMurtry
patent: 7036238 (2006-05-01), Kojima et al.
patent: 7140119 (2006-11-01), Badami et al.
patent: 7197835 (2007-04-01), Takanashi
patent: 2005/0132591 (2005-06-01), Kojima
patent: 0 093 299 (1983-11-01), None
patent: 0 240 151 (1987-10-01), None
patent: 0 335 474 (1989-10-01), None
patent: WO 90/07097 (1990-06-01), None
International Search Report Aug. 9, 2007.
Ayres Jeremy
McDonnell Ivor
Cohen Johnson Amy
RatnerPrestia
Taylor Hobson Limited
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