Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-09-25
2007-09-25
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10866457
ABSTRACT:
The present invention is a method for collecting, analyzing, and displaying statistics regarding block pin placement prior to routing of an integrated circuit. The statistics are graphically displayed in a graphical user interface (GUI). The GUI graphically displays indications of where block pin congestion problems lie, which allows an integrated circuit designer to quickly pinpoint and correct pin placement in areas of pin congestion to alleviate congestion in these areas prior to routing.
REFERENCES:
patent: 5309372 (1994-05-01), Marui et al.
patent: 7065730 (2006-06-01), Alpert et al.
patent: 2001/0049814 (2001-12-01), Matsumoto et al.
patent: 2005/0138595 (2005-06-01), Khakzadi et al.
Benzel Jack Douglas
Gentry Jason Todd
Avago Technologies General IP ( Singapore) Pte. Ltd.
Chiang Jack
Tat Binh
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