Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-06-30
2009-10-13
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07602502
ABSTRACT:
A method of manufacturing an optical element having an optical surface of a non-rotationally symmetric shape is described. Measuring light is generated using an interferometer optics, wherein the interferometer optics has at least one diffractive component having a grating. The optical surface is positioned at a first position relative to the diffractive component, wherein first measuring light diffracted at the diffractive component is incident on the optical surface at plural locations thereof, and at least one first interference pattern generated from first measuring light reflected from the optical surface is detected. The optical surface is positioned at a second position relative to the at least one diffractive component, wherein second measuring light diffracted at the diffractive component is incident on the optical surface at plural locations thereof, and at least one second interference pattern generated from second measuring light reflected from the optical surface is detected.
REFERENCES:
patent: 4340306 (1982-07-01), Balasubramanian
patent: 4732483 (1988-03-01), Biegen
patent: 5473434 (1995-12-01), de Groot
patent: 5488477 (1996-01-01), de Groot
patent: 5777741 (1998-07-01), Deck
patent: 6714308 (2004-03-01), Evans et al.
patent: 6781700 (2004-08-01), Kuchel
patent: 2003/0184762 (2003-10-01), Kim et al.
patent: WO2005/114101 (2005-12-01), None
M. Beyerlin et al. “Dual-wave-front computer generated holograms for quasi-absolute testing of aspherics”, Applied Optics, vol. 41, No. 13, May 1, 2002, pp. 2440-2447.
Daniel Malacara, “Optical Shop Testing”, 2ndEdition, John Wiley & Sons, Inc., 1992, New York, chapters 15.1 (pp. 599-600), 15.2 (pp. 600-603) and 15.3 (pp. 603-612).
J. Hetzler et al., Unpublished U.S. Appl. No. 12/197,035 entitled “Optical System, Method of Manufacturing an Optical System and Method of Manufacturing an Optical Element,” filed Aug. 22, 2008, 70 pages (continuation of U.S. Appl. No. 11/233,435, J. Hetzler et al., filed Sep. 21, 2005).
Andiel Ulrich
Schulte Stefan
Carl Zeiss SMT AG
Chowdhury Tarifur
Cook Jonathon D
Townsend and Townsend / and Crew LLP
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