Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2007-03-20
2007-03-20
Schillinger, Laura M. (Department: 2813)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C438S483000, C438S046000
Reexamination Certificate
active
10713326
ABSTRACT:
Nitride-based film is grown using multiple precursor fluxes. Each precursor flux is pulsed one or more times to add a desired element to the nitride-based film at a desired time. The quantity, duration, timing, and/or shape of the pulses is customized for each element to assist in generating a high quality nitride-based film.
REFERENCES:
patent: 5851905 (1998-12-01), McIntosh et al.
patent: 6673701 (2004-01-01), Marsh et al.
patent: 6933225 (2005-08-01), Werkhoven et al.
patent: 2003/0032281 (2003-02-01), Werkhoven et al.
patent: 2004/0121620 (2004-06-01), Pomarede et al.
patent: 2004/0126954 (2004-07-01), Marsh et al.
patent: 2004/0224484 (2004-11-01), Fareed et al.
patent: 2005/0032342 (2005-02-01), Forbes et al.
patent: 2005/0106893 (2005-05-01), Wilk
patent: 2005/0158977 (2005-07-01), Yeo et al.
patent: 2005/0179097 (2005-08-01), Forbes et al.
patent: 2005/0181555 (2005-08-01), Haukka et al.
“Molecular Beam Epitaxy of Nitride Thin Films,” M. J. Paisley et al., Journal of Crystal Growth, vol. 127, Feb. 2, 1993, pp. 136-142.
“Elastic Strain Relaxation and Piezoeffect in GaN-AlN, GaN-AlGaN and GaN-InGaN Superlattices,” A. D. Bykhovski et al., Journal of Applied Physics, vol. 81, No. 9, May 1, 1997, pp. 6332-6338.
Pulsed Atomic Layer Epitaxy of Quaternary AlInGaN Layers for Ultraviolet Light Emitters, J. P. Zhang et al., Physica Status Solidi(a), vol. 188, No. 1, 2001, pp. 95-99.
“High Optical Quality AllnGaN by Metalorganic Chemical Vapor Deposition,” M. E. Aumer et al., Applied Physics Letters, vol. 75, No. 21, Nov. 22, 1999, pp. 3315-3317.
“Low Temperature Growth of Gallium Nitride,” H. Gotob et al., Japanese Journal of Applied Physics, vol. 20, No. 7, Jul. 1981, pp. L545-L548.
“Energy Band/Lattice Mismatch Engineering in Quaternary AlInGaN/GaN Heterostructure,” M. A. Khan et al., Physica Status Solidi(a), vol. 176, No. 1, 1999, pp. 227-230.
“Strain Energy Bank Engineering Approach to AlN/GaN/InN Heterojunction Devices,” A. Khan et al., Frontiers in Electronics: Future Chips Proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02) St. Croix, Virgin Islands, World Scientific Publishing Co. (Jan. 15, 2003), pp. 195-214 (1-19).
Fareed Qhalid
Gaska Remigijus
Shur Michael
Hoffman Warnick & D'Alessandro LLC
Schillinger Laura M.
Sensor Electronic Technology, Inc.
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