Methods of forming semiconductor constructions

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S424000, C438S437000, C438S787000, C257SE21193, C257SE21212

Reexamination Certificate

active

10925793

ABSTRACT:
The invention includes methods of forming and/or passivating semiconductor constructions. In particular aspects, various oxides of a semiconductor substrate can be formed by exposing semiconductive material of the substrate to deuterium-enriched steam. In other aspects, a semiconductor construction is passivated by subjecting the construction to an anneal at a temperature of greater than or equal to 350° C. while exposing the construction to a deuterium-enriched ambient.

REFERENCES:
patent: 5285096 (1994-02-01), Ando et al.
patent: 6023093 (2000-02-01), Gregor et al.
patent: 7022560 (2006-04-01), Olofsson
patent: 2002/0132493 (2002-09-01), Watt et al.
patent: 2004/0058557 (2004-03-01), Eisele et al.
patent: 2005/0170608 (2005-08-01), Kiyotoshi et al.
patent: 2006/0003595 (2006-01-01), Passlack et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of forming semiconductor constructions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of forming semiconductor constructions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming semiconductor constructions will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3732168

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.