Methods of forming roughened layers of platinum

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S964000, C438S686000, C438S398000

Reexamination Certificate

active

07060615

ABSTRACT:
A method of forming a roughened layer of platinum, including: a) providing a substrate within a reaction chamber; b) forming an adhesion layer over the substrate; c) flowing an oxidizing gas into the reaction chamber; d) flowing a platinum precursor into the reaction chamber and depositing platinum from the platinum precursor onto the adhesion layer in the presence of the oxidizing gas; and e) maintaining a temperature within the reaction chamber at from about 0° C. to less than 300° C. during the depositing.

REFERENCES:
patent: 3856709 (1974-12-01), Porta et al.
patent: 3975304 (1976-08-01), della Porta et al.
patent: 4341662 (1982-07-01), Pfefferle
patent: 4425261 (1984-01-01), Stenius et al.
patent: 4431750 (1984-02-01), McGinnis et al.
patent: 4714693 (1987-12-01), Targos
patent: 4719442 (1988-01-01), Bohara et al.
patent: 5053917 (1991-10-01), Miyasaka et al.
patent: 5208479 (1993-05-01), Mathews et al.
patent: 5320978 (1994-06-01), Hsu
patent: 5330700 (1994-07-01), Soukup et al.
patent: 5525570 (1996-06-01), Chakraborty et al.
patent: 5555486 (1996-09-01), Kingon et al.
patent: 5635420 (1997-06-01), Nishioka
patent: 5639685 (1997-06-01), Zahurak et al.
patent: 5763286 (1998-06-01), Figura et al.
patent: 5783716 (1998-07-01), Baum et al.
patent: 5796648 (1998-08-01), Kawakubo et al.
patent: 5874364 (1999-02-01), Nakabayashi et al.
patent: 5917213 (1999-06-01), Iyer et al.
patent: 5990559 (1999-11-01), Marsh
patent: 6010744 (2000-01-01), Buskirk et al.
patent: 6033953 (2000-03-01), Aoki et al.
patent: 6175129 (2001-01-01), Liu et al.
patent: 6232629 (2001-05-01), Nakamura
patent: 0 415 751 (1991-03-01), None
patent: 0 855 738 (1998-07-01), None
patent: 5-67730 (1992-03-01), None
patent: 9051079 (1997-02-01), None
patent: 9-082666 (1997-03-01), None
patent: H09-239891 (1997-12-01), None
patent: 10173149 (1998-06-01), None
patent: 10180098 (1998-07-01), None
patent: 8017939 (2003-06-01), None
Ju-Hong Kwan et al.; “Characterization of Pt Thin Films Deposited by Metallorganic Chemical Vapor Deposition for Ferroelectric Bottom Electrodes”; J. Electrochem. Soc., vol. 144, No. 8, Aug. 1997; pp. 2848-2854.
M. Ino et al.; “Rugged surface polycrystalline silicon film deposition and its application in a stacked dynamic random access memory capacitor electrode”; J. Vac. Technol. B 14(2), Mar./Apr. 1996; pp. 751-756.
Nasu, T. et al., “Study of Pt Bottom Electrodes Using High-Temperature Sputtering for Ferroelectric Memories with SrBi2Ta2O9(SBTO) Film”, Jpn. J. Appl. Phys. vol. 37, Part 1, No. 7 (Jul. 1998), pp. 4144-4148.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of forming roughened layers of platinum does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of forming roughened layers of platinum, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming roughened layers of platinum will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3657806

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.