Methods of forming patterned reticles

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000

Reexamination Certificate

active

07093227

ABSTRACT:
The invention includes methods of forming patterned reticles. Design features can be introduced into a layout for a reticle prior to optical proximity correction, and then removed prior to taping a pattern onto the reticle. Design features can alternatively, or additionally, be introduced after optical proximity correction and asymmetrically relative to one or more parts of a reticle pattern. The introduced features can subsequently be taped to the reticle as part of the formation of the patterned reticle.

REFERENCES:
patent: 6238824 (2001-05-01), Futrell et al.
patent: 6284443 (2001-09-01), Anderson et al.
patent: 6289824 (2001-09-01), Rieger et al.
patent: 6425117 (2002-07-01), Pasch et al.
patent: 6570174 (2003-05-01), Tounai et al.
patent: 6687895 (2004-02-01), Zhang
patent: 6902854 (2005-06-01), Frankowsky
patent: 2002/0007481 (2002-01-01), Ono
patent: 2002/0047089 (2002-04-01), Tounai et al.
patent: 2002/0158214 (2002-10-01), Lin et al.
patent: 2003/0061592 (2003-03-01), Agrawal et al.
patent: 2003/0118917 (2003-06-01), Zhang et al.
patent: 2003/0211400 (2003-11-01), Smith

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of forming patterned reticles does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of forming patterned reticles, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming patterned reticles will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3625270

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.