Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-06-14
2010-12-14
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S602000, C438S769000, C438S931000, C257SE21294
Reexamination Certificate
active
07851343
ABSTRACT:
A method of forming an ohmic layer for a semiconductor device includes forming a metal layer on a Silicon Carbide (SiC) layer and forming an ablation capping layer on the metal layer. Laser light is impinged through the ablation capping layer to form a metal-SiC material.
REFERENCES:
patent: 4672740 (1987-06-01), Shirai et al.
patent: 5087949 (1992-02-01), Haitz
patent: 5943590 (1999-08-01), Wang et al.
patent: 6110813 (2000-08-01), Ota et al.
patent: 6274889 (2001-08-01), Ota et al.
patent: 6500770 (2002-12-01), Cheng et al.
patent: 6878574 (2005-04-01), Tomoda et al.
patent: 2001/0010702 (2001-08-01), Tanaka
patent: 2001/0017409 (2001-08-01), Hiroki et al.
patent: 2001/0019133 (2001-09-01), Konuma et al.
patent: 2001/0027001 (2001-10-01), Yoshida et al.
patent: 2001/0045932 (2001-11-01), Mukao
patent: 2002/0019084 (2002-02-01), Francis et al.
patent: 2002/0027716 (2002-03-01), Tanaka
patent: 2002/0048829 (2002-04-01), Yamazaki et al.
patent: 2002/0094612 (2002-07-01), Nakamura et al.
patent: 2002/0094613 (2002-07-01), Yamazaki et al.
patent: 2002/0102098 (2002-08-01), Camm et al.
patent: 2002/0119585 (2002-08-01), Yamazaki et al.
patent: 2002/0121642 (2002-09-01), Doverspike et al.
patent: 2002/0125480 (2002-09-01), Nakamura et al.
patent: 2002/0146872 (2002-10-01), Yasumuki et al.
patent: 2002/0158288 (2002-10-01), Yamesaki et al.
patent: 2002/0182783 (2002-12-01), Takayama et al.
patent: 2002/0192914 (2002-12-01), Kizilyalli et al.
patent: 2002/0192931 (2002-12-01), Hazakawa
patent: 2003/0010980 (2003-01-01), Yamazaka et al.
patent: 2003/0013280 (2003-01-01), Yamazaka
patent: 2003/0022471 (2003-01-01), Taketomi et al.
patent: 2003/0059990 (2003-03-01), Yamazaki
patent: 2003/0080099 (2003-05-01), Tanaka et al.
patent: 2003/0087522 (2003-05-01), Ngo et al.
patent: 2003/0090481 (2003-05-01), Kimura
patent: 2003/0094641 (2003-05-01), Gonzalez et al.
patent: 2003/0117352 (2003-06-01), Kimura
patent: 2003/0132931 (2003-07-01), Kimura et al.
patent: 2003/0148594 (2003-08-01), Yamasaki et al.
patent: 2003/0151048 (2003-08-01), Gonzalez et al.
patent: 2003/0164522 (2003-09-01), Kato et al.
patent: 2003/0168437 (2003-09-01), Tanaka
patent: 2003/0173570 (2003-09-01), Yamazaki et al.
patent: 2003/0183875 (2003-10-01), Isobe et al.
patent: 2003/0201496 (2003-10-01), Yamasaki et al.
patent: 2003/0206732 (2003-11-01), Camm et al.
patent: 2004/0012338 (2004-01-01), Smith et al.
patent: 2004/0016969 (2004-01-01), Bohr
patent: 2004/0018672 (2004-01-01), Bohr
patent: 2004/0031961 (2004-02-01), Zhang et al.
patent: 2004/0056915 (2004-03-01), Miyazawa
patent: 2004/0063310 (2004-04-01), Ngo et al.
patent: 2004/0079923 (2004-04-01), Yamazaki et al.
patent: 2004/0080474 (2004-04-01), Kimura
patent: 2004/0151993 (2004-08-01), Hasegawa et al.
patent: 2005/0104072 (2005-05-01), Slater et al.
patent: 2005/0255650 (2005-11-01), Hasunuma et al.
patent: 2007/0026689 (2007-02-01), Nakata et al.
patent: 2008/0173975 (2008-07-01), Chen et al.
International Search Report for PCT/US2004/026210, mailed Dec. 6, 2004.
Eryu, et al. “Formation of an Ohmic Electrode in SiC Using A Pulsed Laser Irradiation Method”Nuclear Instruments and Methods in Physics Research B121:419-421 (1997).
Kalinina, et al. “Effect of Ultrashort Laser Pulses on the Electrophysical Properties of Silicon Carbide”Sov. Tech. Phys. Lett.11(6): 278-279 (1985).
Ota, et al. “Laser Alloying for Ohmic Contacts on SiC at Room Temperature”Materials Science Forumvols. 264-268; pp. 783-786 (1998).
Pender, et al. “Gradients in Elastic Modulus for Improved Contact-Damage Resistance. Part I: The Silicon Nitride-Oxynitride Glass System”Acta Materialia49(2001): 3255-3262, (2001).
Vizváry, et al. “Elasticity Modulus Measurement of Silicon-Nitride” Proceedings of Fourth Conference on Mechanical Engineering, (Eds Penninger A, Kullmann L, Vörös G), BMGE, pp. 215-219, (2004).
Yi and Kim “Tension Test with Single-Crystalline-Silicon Microspecimen” Proc. MEMS (MEMS-vol. 1), ASME Int. Mechanical Engineering Congress and Exposition, Nashville, TN, pp. 81-86 (1999).
Alberti Marc
Mayer Eric
Cree Inc.
Ghyka Alexander G
Mustapha Abdulfattah
Myers Bigel Sibley & Sajovec P.A.
LandOfFree
Methods of forming ohmic layers through ablation capping layers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of forming ohmic layers through ablation capping layers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming ohmic layers through ablation capping layers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4216074