Methods of forming a contact hole in a semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S713000

Reexamination Certificate

active

07105435

ABSTRACT:
Methods for forming a contact hole in a semiconductor device are disclosed. A disclosed method is capable of preventing voids from being formed in a contact hole or a via hole. In particular, when a metal insulation film or an interlayer insulation film is selectively etched to form a contact hole or a via hole, a top edge of the contact hole or the via hole is rounded by using a plasma having spiral movement.

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