Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-12-27
2005-12-27
Sarkar, Asok Kumar (Department: 2891)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S645000, C438S739000
Reexamination Certificate
active
06979641
ABSTRACT:
A dielectric is formed over a node location on a semiconductor substrate. The dielectric comprises an insulative material over the node location, an insulative polish stop layer over the insulative material, and an insulator layer over the insulative polish stop layer. A contact opening is formed into the insulator layer, the insulative polish stop layer and the insulative material to proximate the node location. A conductive material is deposited over the insulator layer and to within the contact opening. The conductive material and the insulator layer are polished to at least a portion of the insulative polish stop layer. In one implementation and prior to depositing the conductive material, at least a portion of the contact opening is widened with an etching chemistry that is selective to widen it within the insulative material to a degree greater than any widening of the contact opening within the insulative polish stop layer.
REFERENCES:
patent: 5439848 (1995-08-01), Hsu et al.
patent: 5516710 (1996-05-01), Boyd et al.
patent: 5518948 (1996-05-01), Walker
patent: 5891799 (1999-04-01), Tsui
patent: 6037246 (2000-03-01), Bhat et al.
patent: 6143648 (2000-11-01), Rodriguez et al.
patent: 6245489 (2001-06-01), Baklanov et al.
patent: 6245663 (2001-06-01), Zhao et al.
patent: 6294314 (2001-09-01), Liao
patent: 2005/0079706 (2005-04-01), Kumar et al.
Micro)n Technology, Inc.
Sarkar Asok Kumar
Wells St. John P.S.
LandOfFree
Methods of forming a conductive contact through a dielectric does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of forming a conductive contact through a dielectric, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming a conductive contact through a dielectric will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3496249