Methods of fabricating highly conductive regions in...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE23010, C257SE23079

Reexamination Certificate

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10299451

ABSTRACT:
Methods of fabricating highly conductive regions in semiconductor substrates for radio frequency applications are used to fabricate two structures: (1) a first structure includes porous Si (silicon) regions extending throughout the thickness of an Si substrate that allows for the subsequent formation of metallized posts and metallized moats in the porous regions; and (2) a second structure includes staggered deep V-grooves or trenches etched into an Si substrate, or some other semiconductor substrate, from the front and/or the back of the substrate, wherein these V-grooves and trenches are filled or coated with metal to form the metallized moats.

REFERENCES:
patent: 4507849 (1985-04-01), Shinozaki
patent: 5166097 (1992-11-01), Tanielian
patent: 5200639 (1993-04-01), Ishizuka et al.
patent: 5508211 (1996-04-01), Yee et al.
patent: 5618752 (1997-04-01), Gaul
patent: 5644156 (1997-07-01), Suzuki et al.
patent: 5665633 (1997-09-01), Meyer
patent: 5767561 (1998-06-01), Frei et al.
patent: 5889314 (1999-03-01), Hirabayashi
patent: 6251739 (2001-06-01), Norstrom et al.
patent: 6261892 (2001-07-01), Swanson
patent: 6432724 (2002-08-01), Ahn et al.
patent: 6459134 (2002-10-01), Ohguro et al.
patent: 6670703 (2003-12-01), Ahn et al.
patent: 6852605 (2005-02-01), Ng et al.
patent: 6911348 (2005-06-01), Becker et al.
patent: 7071052 (2006-07-01), Yeo et al.
patent: 2001/0023111 (2001-09-01), Yuan
patent: 2002/0022362 (2002-02-01), Ahn et al.
patent: 2002/0155655 (2002-10-01), Pon
patent: 2004/0217440 (2004-11-01), Ng et al.
patent: 2005/0124131 (2005-06-01), Hweing et al.
patent: 0 932 204 (1999-07-01), None

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