Methods for repair of photomasks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

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430313, G03F 900

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061656496

ABSTRACT:
A method of repairing defects on masks includes the step of providing a coating on the mask to prevent damage to clear regions of the mask from laser ablation splatter, laser ablation caused quartz pitting, laser deposition staining, and FIB caused gallium staining. The coating is a metal, a polymer, or a carbon material. The coating is formed on clear regions of the mask as well as either over or under the light absorbing material of the mask. A coating comprising a thin copper layer significantly improves imaging with the ion beam while protecting clear regions of the mask from FIB stain. A coating formed of a photosensitive polymer is used to etch opaque defects. While wanted opaque regions adjacent an opaque defect are also etched in this etch step, these created clear defects are then repaired in a subsequent FIB deposition step while a copper coating protects adjacent clear regions from FIB stain. In another embodiment, opaque defects are repaired with a short pulse duration laser without damage to underlying quartz or adjacent clear regions while avoiding the need for a coating.

REFERENCES:
patent: 3748975 (1973-07-01), Tarabocchia
patent: 4105468 (1978-08-01), Geshner et al.
patent: 4190759 (1980-02-01), Hongo et al.
patent: 4200668 (1980-04-01), Segal et al.
patent: 4548883 (1985-10-01), Wagner
patent: 4851097 (1989-07-01), Hattori et al.
patent: 5035787 (1991-07-01), Parker et al.
patent: 5165954 (1992-11-01), Parker et al.
patent: 5270894 (1993-12-01), Neev et al.
patent: 5275895 (1994-01-01), Kusunose
patent: 5357116 (1994-10-01), Talbot et al.
patent: 5364493 (1994-11-01), Hunter, Jr.
patent: 5395718 (1995-03-01), Jensen et al.
patent: 5482802 (1996-01-01), Celler et al.
patent: 5504339 (1996-04-01), Masuda
patent: 5504340 (1996-04-01), Mizumura et al.
patent: 5656186 (1997-08-01), Mourou et al.
P Yan, et al., "Effect of Laser Mask Repair Induced Residue and Quartz Damage in Sub-half-micron DUV Wafer Proceses", 15th Annual Symposium on Photomask Technology and Management, SPIE vol. 2621, pp. 158-166, 1985.
R.J. Sargent, "Photomask Repair Process For Opaque Chrome Defects", IBM Tech. Discl. Bull., vol. 29, No. 3, Aug. 1986, pp. 1378-1379.
James A. Reynolds, "The Printability of Laser Mask Repairs at Deep UV", SPIE, vol. 2621, pp. 145-147, 1985.
P.G. Blauner, "Elimination of Excess Material during Forcused Ion Beam Induced Deposition", IBM Tech. Discl. Bull., vol. 39, No. 01, Jan. 1996, pp. 287-289.
L.H. Kaplan, "Improved Process For Clear Defect Mask Repair", IBM Tech. Discl. Bull., vol. 30, No. 3, Aug. 1987, p. 1069.
R.J. Sargent, "Multilevel Chromium Mask Repair Process For Clear Defects", IBM Tech. Discl. Bull., vol. 29, No. 3, Aug. 1986, p. 1394.
Yang, B. et al: "High Resolution UV Laser Repair of Phase Shifting Photomasks," 14th annual symposium on photomask technology and management, Santa Clara, CA, USA, 14-16 Sep. 1994, vol. 2322, pp. 35-47, XP002080959 ISSSN 0277-786X, Proceedings of the SPIE, 1994, USA.
Preuss, S. et al: "Sub-picosecond UV Laser Ablation of Metals," Applied Physics A (Materials Science Processing), Jul. 1995, Germany, vol. No. 1, pp. 33-37, XP002080958 ISSN 0947-8396.
Patent Abstracts of Japan vol. 012, No. 259 (P-733), Jul. 21, 1988 & JP 63 047769 A (OKI Electric Ind. Co. Ltd.), Feb. 29, 1988.
Patent Abstracts of Japan vol. 013, No. 012 (P-812), Jan. 12, 1989 & JP 63 218959 A (Sharp Corp), Sep. 12, 1988.
Patent Abstracts of Japan vol. 010, No. 228 (E-426), Aug. 8, 1986 & JP 61 063029 A (Sanyo Electric Co. Ltd; Others: 01), Apr. 1, 1986.
Patent Abstracts of Japan vol. 014, No. 337 (P-1079), Jul. 20, 1990 & JP 02 115842 A (Hitachi Ltd.), Apr. 27, 1990.
DE 37 05 360 A (Fraunhofer Ges Forschung) Aug. 25, 1988.
Patent Abstracts of Japan vol. 010, No. 091 (E-394), Apr. 9, 1986 & JP 60 235422 A (Sharp KK), Nov. 22, 1985.
EP 0 599 367 A (Schlumberger Technologies Inc.) Jun. 1, 1994.
Patent Abstracts of Japan, 08 328239 A, Dec. 13, 1996 (OKI Electric Ind. Co. Ltd) May 1995.
Patent Abstracts of Japan 08 123012 A, May 17, 1996, OKI Electric Ind. Co. Ltd., Oct. 25, 1994.
Abstract 3-9354 (A) Jan. 17, 1991 JP, 64-143248 Jun. 6, 1989, Dainipron Printing Co. Ltd.
Abstract 3-139647 (A) Jun. 13, 1991 JP, 64-279154, Dec. 26, 1989, Fujitsu Ltd.
Abstract 4-449, Jan. 6, 1992 JP, 2-100357, Apr. 18, 1990, Mitsubishi Electric Corp.
Abstract 4-26846 (A) Jan. 30, 1992, 2-131629, May 1990, Sony Corp.

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