Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1984-10-12
1988-07-26
Dawson, Robert A.
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
148DIG105, 148DIG111, 156656, 437184, 437912, H01L 2128, H01L 21288
Patent
active
047598220
ABSTRACT:
A method of electrolytic deposition of metal is used to decrease the minimum size pattern that can be obtained using photolithography. In the manufacture of integrated circuits, a layer of metal and then photoresist is deposited on the dielectric layer of the substrate prior to masking to define the gate apertures. After masking and etching through to the dielectric, metal is electrodeposited on the metal edges that abut the gate aperture, thus decreasing the aperture size. After that decreased gate dimension is etched into the dielectric to define the gate lengths of the semiconductor devices, the wafer is stripped and the subsequent manufacture proceeds in the conventional manner.
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Jackson, T. N. et al., "A Novel Submicron Fabrication Technique", IEEE IEDM Sect. 3.6, Sep. 1979, pp. 58-61.
Lane Susette R.
Vetanen William A.
Dawson Robert A.
Hoch Ramon
Lovell William S.
Smith-Hill John
TriQuint Semiconductor Inc.
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