Methods for optimizing package and silicon co-design of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C438S108000, C257S777000, C257S778000, C257S676000, C257S678000

Reexamination Certificate

active

07117467

ABSTRACT:
The present invention is directed to methods for optimizing package and silicon co-design of an integrated circuit. A composite bump pattern for an integrated circuit is created based on a first library including at least one bump pattern template. PCB and Die constraints of the integrated circuit are then reviewed. A partial package design for the integrated circuit is generated based on a second library including at least one partial package template. A partial silicon design for said integrated circuit is started. A full package design for the integrated circuit is then completed. A full silicon design for the integrated circuit is completed.

REFERENCES:
patent: 6594811 (2003-07-01), Katz
patent: 6941537 (2005-09-01), Jessep et al.
patent: 6952814 (2005-10-01), Joseph et al.
patent: 2003/0032217 (2003-02-01), Farnworth et al.
patent: 2004/0098690 (2004-05-01), Joseph et al.
patent: 2005/0127483 (2005-06-01), Joshi et al.
patent: 2005/0269714 (2005-12-01), Akram et al.

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