Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-07-26
2005-07-26
Menta, Bhavesh M. (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C348S383000, C353S033000, C353S069000, C356S139070, C356S140000, C356S147000, C356S150000, C356S445000, C356S458000, C382S148000, C382S151000, C606S005000
Reexamination Certificate
active
06922483
ABSTRACT:
Methods for measuring the low spatial reflectivity uniformity of a DMD spatial light modulator. These methods are unique since they compensate for the non-uniformities introduced by the tilt angle of the DMD mirrors in addition to the normal system non-uniformities introduced by the illumination source and optics. These methods flatten the image and remove all but the low spatial non-uniformities from the DMD mirrors.
REFERENCES:
patent: 5442462 (1995-08-01), Guissin
patent: 5485279 (1996-01-01), Yonemitsu et al.
patent: 5673151 (1997-09-01), Rallison
patent: 5760944 (1998-06-01), Minakuchi et al.
patent: 5796508 (1998-08-01), Suzuki
patent: 5796526 (1998-08-01), Anderson
patent: 6016152 (2000-01-01), Dickie
patent: 6310650 (2001-10-01), Johnson et al.
patent: 6450647 (2002-09-01), Takeuchi
patent: 6471356 (2002-10-01), Gohman et al.
patent: 6483641 (2002-11-01), MacAulay
patent: 6485145 (2002-11-01), Cotton et al.
patent: 6508812 (2003-01-01), Williams et al.
patent: 6520646 (2003-02-01), Rodriguez et al.
Brady III Wade James
Brill Charles A.
Desire Gregory
Menta Bhavesh M.
Telecky , Jr. Frederick J.
LandOfFree
Methods for measuring DMD low frequency spatial uniformity does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods for measuring DMD low frequency spatial uniformity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for measuring DMD low frequency spatial uniformity will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3368546