Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2011-01-11
2011-01-11
Walker, Amanda C. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S005000, C430S311000, C430S312000, C430S322000, C430S331000, C430S394000, C430S396000, C430S270100
Reexamination Certificate
active
07867693
ABSTRACT:
Methods for forming device structures on a wafer are provided. One method includes transferring approximately an inverse of patterned features formed in a positive resist layer on the wafer to a device material on the wafer to form the device structures in the device material. Another method includes transferring approximately an inverse of patterned features formed in a sacrificial layer on the wafer to a device material on the wafer to form the device structures in the device material.
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KLA-Tencor Technologies Corp.
Mewherter Ann Marie
Walker Amanda C.
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