Methods for forming a titanium nitride layer

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21169

Reexamination Certificate

active

07846824

ABSTRACT:
Methods for forming titanium nitride layers are provided herein. In some embodiments, a method of forming a titanium nitride layer on a substrate may include providing a substrate into a processing chamber having a target comprising titanium disposed therein; supplying a nitrogen-containing gas into the processing chamber; sputtering a titanium source material from the target in the presence of a plasma formed from the nitrogen-containing gas to deposit a titanium nitride layer on the substrate; and upon depositing the titanium nitride layer to a desired thickness, forming a magnetic field that biases ions in the processing chamber away from the substrate.

REFERENCES:
patent: 7253109 (2007-08-01), Ding et al.
patent: 2005/0136656 (2005-06-01), Zeng et al.
patent: 2007/0193982 (2007-08-01), Brown et al.
patent: 2007/0241458 (2007-10-01), Ding et al.
patent: 1211332 (2002-06-01), None
patent: 7-113170 (1995-05-01), None
patent: 10-1998-021727 (1998-06-01), None
International Search Report and Written Opinion mailed Oct. 26, 2009 for PCT Application No. PCT/US2009/037525.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for forming a titanium nitride layer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for forming a titanium nitride layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for forming a titanium nitride layer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4218975

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.