Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-05-29
2007-05-29
Tsai, H. Jey (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S630000, C438S648000, C438S651000, C257SE21593
Reexamination Certificate
active
11112356
ABSTRACT:
A metal contact in a semiconductor device is formed by forming an insulating layer having a contact hole therein on a silicon substrate. A cobalt layer is formed on a bottom and inner walls of the contact hole. A cobalt silicide layer is formed at the bottom of the contact hole while forming a titanium layer on the cobalt layer. A plug is formed on the titanium layer so as to fill the contact hole.
REFERENCES:
patent: 5700722 (1997-12-01), Sumi
patent: 5998873 (1999-12-01), Blair et al.
patent: 6091148 (2000-07-01), Givens et al.
patent: 6271122 (2001-08-01), Wieczorek et al.
patent: 6297555 (2001-10-01), Zhao et al.
patent: 2002/0019119 (2002-02-01), Saigal et al.
patent: 2002/0093097 (2002-07-01), Kamoshima et al.
patent: 2002/0119653 (2002-08-01), Yamane
patent: 2001/0107133 (2003-06-01), Kazuo
patent: 2003/0107133 (2003-06-01), Tomita
Choi Gil-heyun
Kang Sang-bum
Moon Kwang-jin
Park Hee-sook
Park Seong-geon
Myers Bigel & Sibley Sajovec, PA
Tsai H. Jey
LandOfFree
Methods for forming a metal contact in a semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods for forming a metal contact in a semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for forming a metal contact in a semiconductor... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3773382