Methods for forming a metal contact in a semiconductor...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S630000, C438S648000, C438S651000, C257SE21593

Reexamination Certificate

active

11112356

ABSTRACT:
A metal contact in a semiconductor device is formed by forming an insulating layer having a contact hole therein on a silicon substrate. A cobalt layer is formed on a bottom and inner walls of the contact hole. A cobalt silicide layer is formed at the bottom of the contact hole while forming a titanium layer on the cobalt layer. A plug is formed on the titanium layer so as to fill the contact hole.

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patent: 2002/0119653 (2002-08-01), Yamane
patent: 2001/0107133 (2003-06-01), Kazuo
patent: 2003/0107133 (2003-06-01), Tomita

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