Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2008-05-13
2008-05-13
Duda, Kathleen (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S329000
Reexamination Certificate
active
07371507
ABSTRACT:
Methods for fabricating semiconductor devices are disclosed. A disclosed method comprises: forming a conductive layer, depositing a interlayer dielectric layer, forming an anti-reflective coating layer on the interlayer dielectric layer, forming a photoresist pattern on the anti-reflection layer, dry-etching the anti-reflective coating layer and the interlayer dielectric layer using the photoresist pattern as a mask and performing an Ar and fluoric plasma treatment to remove a residual layer deposited during the etching of the ARC layer and the ILD.
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Dongbu Electronics Co. Ltd.
Duda Kathleen
Saliwanchik Lloyd & Saliwanchik
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