Etching a substrate: processes – Gas phase etching of substrate – Etching a multiple layered substrate where the etching...
Patent
1996-06-26
1999-05-18
Nuzzolillo, Maria
Etching a substrate: processes
Gas phase etching of substrate
Etching a multiple layered substrate where the etching...
438743, 438738, 438740, C03C15/00
Patent
active
059048620
ABSTRACT:
A method in a plasma processing chamber for etching through a selected portion of a borophosphosilicate glass (BPSG) layer of a wafer layer stack. The method includes the step of introducing an etchant source gas into the plasma processing chamber, which consists essentially of CO, CHF.sub.3, and C.sub.4 F.sub.8. The method further includes the step of striking a plasma in the plasma processing chamber from the etchant source gas. Additionally, there is included the step of etching at least partially through the BPSG layer with the plasma.
REFERENCES:
patent: 5556501 (1996-09-01), Collins et al.
patent: 5589413 (1996-12-01), Sung et al.
patent: 5611888 (1997-03-01), Bosch et al.
patent: 5626716 (1997-05-01), Bosch et al.
Alterio Donna Lee
Chu Dinh Lau
Lam Research Corporation
Nuzzolillo Maria
Weiner Laura
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