Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2011-06-14
2011-06-14
Le, Vu A (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S189150
Reexamination Certificate
active
07961538
ABSTRACT:
Methods for measuring the resistance of multiple memory elements are disclosed. The memory elements may be multi-bit memory and through precise measurement of resistance of the multi-bit memory elements, determination of how many and which memory elements fall into specific memory ranges can be accomplished. Furthermore, storage and/or display of this information may allow for the creation of resistance distribution histograms for modeling of one or more memory arrays.
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Porter John D.
Taylor Jennifer
Fletcher Yoder
Le Vu A
Micro)n Technology, Inc.
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