Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-02-22
2011-02-22
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07895545
ABSTRACT:
A method for designing a chip a priori for design subsetting, feature analysis, and yield learning. The method includes identifying a plurality of signal paths within a chip design that can be readily identified from chip fail data and removing a fraction of the plurality of signal paths that have physical design constraints to generate a subset of the plurality of signal paths. The method further includes constructing a physical implementation of each of the signal paths in the subset, identifying one or more signal paths in the subset that are not constructed consistently with the respective physical implementation, and removing those signal paths from the subset.
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Cohn John M.
Pastel Leah M.
Tellez Gustavo E.
Chiang Jack
Dimyan Magid Y
International Business Machines - Corporation
Wood Herron & Evans LLP
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