Methods for cleaning a semiconductor substrate having a...

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S906000, C438S296000, C257SE21224

Reexamination Certificate

active

11194794

ABSTRACT:
A method for cleaning a semiconductor substrate forming device isolation layers in a predetermined region of a semiconductor substrate to define active regions; etching predetermined areas of the active regions to form a recess channel region and such that sidewalls of the device isolation layers are exposed; and selectively etching a surface of the recess channel region using a predetermined cleaning solution to clean the semiconductor substrate where the recess channel region has been formed.

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patent: 6040232 (2000-03-01), Gau
patent: 6066609 (2000-05-01), Martin et al.
patent: 6703271 (2004-03-01), Yeo et al.
patent: 6991985 (2006-01-01), Dong et al.
patent: 06-112179 (1994-04-01), None
patent: 07-240394 (1995-09-01), None
patent: 2002-313768 (2002-10-01), None

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