Methods, devices, and systems for experiencing reduced...

Details Methods, devices, and systems for experiencing reduced... Methods, devices, and systems for experiencing reduced...

2011-06-21

2011-06-21

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S200000

Reexamination Certificate

active

07966530

ABSTRACT:
One or more embodiments of the present invention reduce uneven degradation during testing by providing for a toggling signal to be applied to remaining input paths which do not receive test signals. Therefore, rather than being held in a fixed state during the burn-in process, the remaining inputs are toggled as well. Consequently, they degrade at a more similar rate as their counterpart inputs that did receive test signals.

REFERENCES:
patent: 5734661 (1998-03-01), Roberts et al.
patent: 7333098 (2008-02-01), Kobayashi
patent: 2008/0291761 (2008-11-01), Lee et al.

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