Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-04
2010-02-23
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07669160
ABSTRACT:
Simultaneous Dynamical Integration modeling techniques are applied to placement of elements of integrated circuits as described by netlists specifying interconnection of devices. Solutions to a system of coupled ordinary differential equations in accordance with Newtonian mechanics are approximated by numerical integration. A resultant time-evolving system of nodes moves through a continuous location space in continuous time, and is used to derive placements of the devices having one-to-one correspondences with the nodes. Nodes under the influence of net attractive forces, computed based on the interconnections between the morphable devices, tend to coalesce into well-organized topologies. Nodes are also affected by spreading forces determined by density fields that are developed based on local spatial node populations. The forces are optionally selectively modulated as a function of simulation time. The placements of the devices are compatible with various design flows, such as standard cell, structured array, gate array, and field-programmable gate array.
REFERENCES:
patent: 5568636 (1996-10-01), Koford
patent: 5754444 (1998-05-01), Koford
patent: 5818726 (1998-10-01), Lee
patent: 5838583 (1998-11-01), Varadarajan et al.
patent: 5875117 (1999-02-01), Jones et al.
patent: 6085032 (2000-07-01), Scepanovic et al.
patent: 6088519 (2000-07-01), Koford
patent: 6282693 (2001-08-01), Naylor et al.
patent: 6301693 (2001-10-01), Naylor et al.
patent: 6360356 (2002-03-01), Eng
patent: 6557153 (2003-04-01), Dahl et al.
patent: 6591407 (2003-07-01), Kaufman et al.
patent: 6662348 (2003-12-01), Naylor et al.
patent: 6665851 (2003-12-01), Donelly et al.
patent: 6671859 (2003-12-01), Naylor et al.
patent: 6725438 (2004-04-01), van Ginneken
patent: 6757878 (2004-06-01), Srinivasan et al.
patent: 6766500 (2004-07-01), Donelly et al.
patent: 6782520 (2004-08-01), Igusa et al.
patent: 6901567 (2005-05-01), Irie
patent: 6910199 (2005-06-01), Sachs
patent: 6957407 (2005-10-01), Suto
patent: 7065729 (2006-06-01), Chapman
patent: 7103863 (2006-09-01), Riepe et al.
patent: 7178118 (2007-02-01), Ramachandran et al.
patent: 2002/0138816 (2002-09-01), Sarrafzadeh et al.
patent: 2004/0078770 (2004-04-01), Miller et al.
patent: 2004/0123262 (2004-06-01), Shirota et al.
patent: 2004/0225971 (2004-11-01), Donelly et al.
patent: 2004/0225982 (2004-11-01), Donelly et al.
patent: 2004/0230931 (2004-11-01), Barbee et al.
patent: 2005/0125758 (2005-06-01), Lembach et al.
patent: 2005/0278667 (2005-12-01), Boucher et al.
patent: WO 2007/002799 (2007-01-01), None
Naveed A. Sherwani, Algorithms for VLSI Physical Design Automation, Third Edition, Springer, Nov. 30, 1998, pp. 219-246.
Michael John Sebastian Smith, Application-Specific Integrated Circuits, Pearson Education, Inc., 1997, pp. 873-893.
Giovanni De Micheli, Synthesis and Optimization of Digital Circuits, McGraw-Hill, 1994, pp. 185-216.
Hockney, R.W. and Eastwood, J.W., Computer Simulation Using Particles, Adam Hilger, 1989, pp. 1-43, 94-165.
Hockney, R.W. and Eastwood, J.W., Computer Simulation Using Particles, Adam Hilger, 1989, pp. 166-265.
Hockney, R.W. and Eastwood, J.W., Computer Simulation Using Particles, Adam Hilger, 1989, pp. 266-352.
Birdsall, Charles K. and Langdon, A. Bruce, Plasma Physics Via Computer Simulation, McGraw-Hill Book Company, 1985, pp. 1-79.
Birdsall, Charles K. and Langdon, A. Bruce, Plasma Physics Via Computer Simulation, McGraw-Hill Book Company, 1985, pp. 155-253.
Bose Subhasis
Furnish Geoffrey Mark
LeBrun Maurice J.
Chiang Jack
Schwabe Williamson & Wyatt P.C.
Tat Binh C
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