Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-02-09
2009-08-04
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07571419
ABSTRACT:
A design application improves design checking by utilizing a template. During the checking process, the design application divides the design layout into regions. To further improve processing speed, the design application utilizes the template. The template maps the location of the regions of a design layout during a checking process. The template comprises information such as the dimensions and location of the regions in human-readable form. Because the human-readable template is computationally simple to process, the design application may locate, divide, manage, and merge the regions of the design layout more quickly.
REFERENCES:
patent: 2004/0225986 (2004-11-01), Lin et al.
patent: 2007/0055953 (2007-03-01), Fang et al.
patent: 2007/0288878 (2007-12-01), Tai et al.
Brady III Wade J.
Chiang Jack
Dimyan Magid Y
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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