Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2005-10-28
2008-10-21
Lauchman, L. G. (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
C356S127000, C356S226000
Reexamination Certificate
active
07440088
ABSTRACT:
Methods and devices are provided for profiling a beam of light that includes a wavelength λ. The beam of light is received. Secondary light is generated at a wavelength λ′ different from wavelength λ by fluorescing a material with the received beam of light. The secondary light is separated from the received beam of light. The separated secondary light is optically directed to a sensor.
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Adams Bruce
Jennings Dean C.
Thomas Timothy N.
Alli Iyabo S
Applied Materials Inc.
Lauchman L. G.
Townsend and Townsend / and Crew LLP
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