Methods and apparatuses for timing analysis of electronic...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

07747972

ABSTRACT:
Methods and apparatuses for timing analysis are provided using stages having an input and at least one output. A circuit portion connected to the output is taken into account when analyzing the stage.

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