Methods and apparatuses for test circuitry for a...

Details Methods and apparatuses for test circuitry for a... Methods and apparatuses for test circuitry for a...

2006-01-31

2006-01-31

Nguyen, VanThu (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S185070, C365S185180, C365S131000, C365S189090

Reexamination Certificate

active

06992938

ABSTRACT:
Various apparatuses and methods are shown in which an integrated circuit includes a dual-polarity non-volatile memory cell and a test circuit. The test circuit has a bias voltage generator and a first switch. The bias voltage generator couples to the dual-polarity non-volatile memory cell via the first switch.

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