Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-05-04
2008-05-20
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07376919
ABSTRACT:
Methods and apparatuses to automatically determine conditions at hierarchical boundaries of a hierarchical circuit design and to use the determined conditions in hierarchical optimization and verification. In one embodiment, a hierarchical block is optimized and transformed during design synthesis using one or more lemmas at the boundary of the hierarchical block. For example, the lemmas are automatically generated to specify range information for input boundary nodes. The lemmas are also used for the equivalence checker to perform hierarchical equivalence checking. Equivalence of hierarchical blocks is individually checked, in view of the lemmas. Thus, based on the lemmas, optimizations across hierarchical boundaries can be performed, while the hierarchical structure of the design is preserved so that equivalence checking of hierarchical circuit designs can still be based on the equivalence of individual hierarchical blocks.
REFERENCES:
patent: 6026222 (2000-02-01), Gupta et al.
patent: 6668362 (2003-12-01), McIlwain et al.
patent: 6912700 (2005-06-01), Franco et al.
patent: 7131078 (2006-10-01), Maheshwari et al.
McElvain Kenneth S.
Seshadri Vijay
Blakely , Sokoloff, Taylor & Zafman LLP
Siek Vuthe
Synplicity, Inc.
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