Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-06-20
2006-06-20
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S142000
Reexamination Certificate
active
07065457
ABSTRACT:
The present invention, in one embodiment, is a method for operating an electronic electric meter having current and voltage sensors configured to generate measurements of current and voltage, respectively; a microcomputer coupled to the current and voltage sensors and having on-chip masked read only memory (ROM); and a nonvolatile, alterable memory coupled to the microcomputer. The method includes steps of: storing vectors pointing to program portions of the ROM in the non-volatile memory; and using the stored vectors to operate the microcomputer to execute the program portions stored in the ROM to control operation of the meter.
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Germer Warren R.
Lavoie Gregory P.
Lee, Jr. Robert E.
Ouellette Maurice J.
Plis Mark J.
Armstrong Teasdale LLP
Charioui Mohamed
General Electric Company
Hoff Marc S.
Vick, Esq. Karl A.
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