Methods and apparatus for testing integrated circuits

Details Methods and apparatus for testing integrated circuits Methods and apparatus for testing integrated circuits

2003-08-07

2008-08-26

Kerveros, James C. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

07418637

ABSTRACT:
In some aspects a method is provided for testing an integrated circuit (IC). The method includes the steps of selecting a bit from each of a plurality of memory arrays formed on an IC chip, selecting one of the plurality of memory arrays, and storing the selected bit from the selected memory array. Numerous other aspects are provided.

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