Methods and apparatus for testing data lines

Details Methods and apparatus for testing data lines Methods and apparatus for testing data lines

2005-08-02

2005-08-02

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C714S740000, C327S078000, C327S028000

Reexamination Certificate

active

06925588

ABSTRACT:
Systems and methods for testing data lines to determine signal degradation in the data lines. A system includes a signal generator for generating a test pattern and for transferring the test pattern through the data lines. The system also includes an analyzer communicatively connected to the data lines to determine degradation of the test pattern in the data lines. The signal generator generates and transfers a first test pattern through the data lines. The first test pattern includes a first portion having a first polarity and a second portion having a second polarity. The signal generator then generates and transfers a second test pattern through the data lines in response to transferring the first test pattern. The test patterns may be repeated one or more times to determine cross talk caused by inductive coupling between data lines and additive reflections.

REFERENCES:
patent: 5214654 (1993-05-01), Oosawa
patent: 5243603 (1993-09-01), Broeren
patent: 5436910 (1995-07-01), Takeshima et al.
patent: 6609221 (2003-08-01), Coyle et al.

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