Methods and apparatus for testing and burn-in of...

Details Methods and apparatus for testing and burn-in of... Methods and apparatus for testing and burn-in of...

2005-02-15

2005-02-15

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06856155

ABSTRACT:
A testing scheme for ball-grid array devices of different sizes where the same ball-grid pattern may be tested using the same set of test adapters. A testing scheme includes providing a plurality of devices having a predetermined pattern of solder balls attached, providing a plurality of adapters secured to a test board, each of the adapters including a plurality of test contacts arranged in a pattern corresponding to the predetermined pattern of solder balls, removably attaching the plurality of devices to a device holding apparatus such that the predetermined pattern of solder balls on the devices corresponds to the predetermined pattern of test contacts on the plurality of adapters, then positioning the device holding apparatus to bring the plurality of solder balls in contact with the plurality of test contacts.

REFERENCES:
patent: 4970577 (1990-11-01), Ogihara et al.
patent: 5476818 (1995-12-01), Yanof et al.
patent: 5477160 (1995-12-01), Love
patent: 6400169 (2002-06-01), Hembree
patent: 6636057 (2003-10-01), Uchikura

Affiliated with

Also associated with

Rating

Methods and apparatus for testing and burn-in of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for testing and burn-in of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for testing and burn-in of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3455240