Methods and apparatus for storing memory test information

Details Methods and apparatus for storing memory test information Methods and apparatus for storing memory test information

2007-02-13

2007-02-13

Kerveros, James C (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

Reexamination Certificate

active

10160640

ABSTRACT:
A method for storing memory test information includes the steps of storing a portion of information related to locations and numbers of failed memory cells detected while testing memory, and updating the stored information as failed memory cells are detected to indicate a first type of memory spare is to be assigned to repair a failed memory cell, a second complementary type of memory spare is to be assigned to repair the failed memory cell, or the memory is not repairable. The first type of memory spare corresponds to one of a row and a column portion of memory and the second complementary type of memory spare corresponds to the other of the row and column portions of memory.

REFERENCES:
patent: 6795942 (2004-09-01), Schwarz
patent: 10-222999 (1998-08-01), None
patent: 2000-348498 (2000-12-01), None
patent: 2001-043698 (2001-02-01), None
U.S. Appl. No. 10/164,513, filed Jun. 6, 2002, Mullins et al.

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