Methods and apparatus for material control system interface

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C700S101000, C700S115000, C700S121000, C700S228000, C414S222010

Reexamination Certificate

active

07603196

ABSTRACT:
Methods and apparatus are provided for managing movement of small lots between processing tools within an electronic device manufacturing facility. In some embodiments, a number of priority lots to be processed is determined and an equivalent number of carrier storage locations are reserved at a substrate loading station of a processing tool. The number of reserved carrier storage locations are made available either by processing and advancing occupying non-priority lots and/or moving unprocessed occupying non-priority lots from the substrate loading station. Priority lots are then transferred to the reserved carrier storage locations. Other embodiments are provided.

REFERENCES:
patent: 3845286 (1974-10-01), Aronstein et al.
patent: 3952388 (1976-04-01), Hasegawa et al.
patent: 4027246 (1977-05-01), Caccoma et al.
patent: 4166527 (1979-09-01), Beezer
patent: 5183378 (1993-02-01), Asano et al.
patent: 5256204 (1993-10-01), Wu
patent: 5372471 (1994-12-01), Wu
patent: 5382127 (1995-01-01), Garric et al.
patent: 5388945 (1995-02-01), Garric et al.
patent: 5390785 (1995-02-01), Garric et al.
patent: 5411358 (1995-05-01), Garric et al.
patent: 5442561 (1995-08-01), Yoshizawa et al.
patent: 5544350 (1996-08-01), Hung et al.
patent: 5612886 (1997-03-01), Weng
patent: 5668056 (1997-09-01), Wu et al.
patent: 5696689 (1997-12-01), Okumura et al.
patent: 5811211 (1998-09-01), Tanaka et al.
patent: 5818716 (1998-10-01), Chin et al.
patent: 5825650 (1998-10-01), Wang
patent: 5884392 (1999-03-01), Lafond
patent: 5888042 (1999-03-01), Oda
patent: 5957648 (1999-09-01), Bachrach
patent: 5971585 (1999-10-01), Dangat et al.
patent: 5976199 (1999-11-01), Wu et al.
patent: 6026561 (2000-02-01), Lafond
patent: 6048259 (2000-04-01), Asai
patent: 6050768 (2000-04-01), Iwasaki et al.
patent: 6053688 (2000-04-01), Cheng
patent: 6074443 (2000-06-01), Venkatesh et al.
patent: 6082948 (2000-07-01), Fishkin et al.
patent: 6128588 (2000-10-01), Chacon
patent: 6183186 (2001-02-01), Howells et al.
patent: 6196001 (2001-03-01), Tannous et al.
patent: 6240335 (2001-05-01), Wehrung et al.
patent: 6256550 (2001-07-01), Wu et al.
patent: 6351686 (2002-02-01), Iwasaki et al.
patent: 6415260 (2002-07-01), Yang et al.
patent: 6431814 (2002-08-01), Christensen et al.
patent: 6439822 (2002-08-01), Kimura et al.
patent: 6463350 (2002-10-01), Fukuda et al.
patent: 6526329 (2003-02-01), Tateyama et al.
patent: 6540466 (2003-04-01), Bachrach
patent: 6579052 (2003-06-01), Bonora et al.
patent: 6580967 (2003-06-01), Jevtic et al.
patent: 6587744 (2003-07-01), Stoddard et al.
patent: 6602037 (2003-08-01), Winkler
patent: 6640148 (2003-10-01), Miller et al.
patent: 6641350 (2003-11-01), Nakashima et al.
patent: 6662076 (2003-12-01), Conboy et al.
patent: 6673638 (2004-01-01), Bendik et al.
patent: 6675066 (2004-01-01), Moshgbar
patent: 6684124 (2004-01-01), Schedel et al.
patent: 6702099 (2004-03-01), Otaguro et al.
patent: 6715602 (2004-04-01), Gartland
patent: 6745093 (2004-06-01), Kawano et al.
patent: 6788996 (2004-09-01), Shimizu
patent: 6839603 (2005-01-01), Karasawa
patent: 6853876 (2005-02-01), Wehrung et al.
patent: 6854583 (2005-02-01), Horn
patent: 6873963 (2005-03-01), Westbury et al.
patent: 6917844 (2005-07-01), Kawano et al.
patent: 6943047 (2005-09-01), Yanagisawa et al.
patent: 6971500 (2005-12-01), Horn
patent: 7039495 (2006-05-01), Conboy et al.
patent: 7051870 (2006-05-01), Schoendienst et al.
patent: 7072730 (2006-07-01), Kobayashi et al.
patent: 7077264 (2006-07-01), Rice et al.
patent: 7156221 (2007-01-01), Rice et al.
patent: 7177716 (2007-02-01), Duffin et al.
patent: 7221993 (2007-05-01), Rice et al.
patent: 2001/0038783 (2001-11-01), Nakashima et al.
patent: 2001/0051837 (2001-12-01), Tateyama et al.
patent: 2002/0081181 (2002-06-01), Yokomori et al.
patent: 2002/0094588 (2002-07-01), Fan et al.
patent: 2002/0114684 (2002-08-01), Jeong
patent: 2002/0116086 (2002-08-01), Huber et al.
patent: 2002/0144654 (2002-10-01), Elger et al.
patent: 2002/0155705 (2002-10-01), Shimizu
patent: 2002/0182040 (2002-12-01), Kimura et al.
patent: 2002/0192055 (2002-12-01), Kobayachi et al.
patent: 2002/0198623 (2002-12-01), Jevtic et al.
patent: 2003/0108407 (2003-06-01), Ogata et al.
patent: 2003/0113190 (2003-06-01), Bachrach
patent: 2003/0202866 (2003-10-01), Weng
patent: 2003/0233262 (2003-12-01), Chorely et al.
patent: 2004/0049398 (2004-03-01), Gartland et al.
patent: 2004/0062633 (2004-04-01), Rice et al.
patent: 2004/0187342 (2004-09-01), Izuta
patent: 2004/0225393 (2004-11-01), Kawano et al.
patent: 2004/0249494 (2004-12-01), Kobayashi et al.
patent: 2004/0262132 (2004-12-01), Pauley et al.
patent: 2005/0036856 (2005-02-01), Yamashita
patent: 2005/0071043 (2005-03-01), Jevtic et al.
patent: 2005/0096775 (2005-05-01), Wang et al.
patent: 2005/0209721 (2005-09-01), Teferra et al.
patent: 2007/0124010 (2007-05-01), Duffin et al.
patent: 2007/0276530 (2007-11-01), Duffin et al.
patent: 2007/0276531 (2007-11-01), Teferra et al.
patent: 19715974 (1998-10-01), None
patent: 0 365 589 (1992-09-01), None
patent: 0 663 686 (1995-07-01), None
patent: 0 850 720 (1998-07-01), None
patent: 1128246 (2001-08-01), None
patent: 1164437 (2001-12-01), None
patent: 55091839 (1980-07-01), None
patent: 58028860 (1983-02-01), None
patent: 60049623 (1985-03-01), None
patent: 63234511 (1988-09-01), None
patent: 01181156 (1989-07-01), None
patent: 01257549 (1989-10-01), None
patent: 02015647 (1990-01-01), None
patent: 05128131 (1993-05-01), None
patent: 05290053 (1993-11-01), None
patent: 06132696 (1994-05-01), None
patent: 06260545 (1994-09-01), None
patent: 08249044 (1996-09-01), None
patent: 09115817 (1997-05-01), None
patent: 10135096 (1998-05-01), None
patent: 11176717 (1999-07-01), None
patent: 11296208 (1999-10-01), None
patent: 2000012646 (2000-01-01), None
patent: 01332464 (2001-11-01), None
patent: 03007584 (2003-01-01), None
patent: 528707 (2001-10-01), None
patent: 558545 (2003-11-01), None
patent: WO 99/28952 (1999-06-01), None
patent: WO 2005/006408 (2005-01-01), None
Przewlocki, H. et al., “Diastemos-computerized system of IC manufacturing control and diagnostics”, 1990, Elektronika, vol. 31 No. 11-12, pp. 38-40, Polish Language. (Abstract only).
Lovell, A. M. et al., “Cell automation: integrating manufacturing with robotics”, Dec. 1990, Solid State Technology, vol. 33 No. 12, p. 37-9.
Prasad, K., “A generic computer simulation model to characterize photolithography manufacturing area in an IC FAB facility”, Sep. 1991, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol. 14 No. 3, p. 483-7.
Ehteshami, B. et al., “Trade-offs in cycle time management: hot lots”, May 1992, IEEE Transactions on Semiconductor Manufacturing, vol. 5 No. 2, p. 101-6.
Lou, S. et al., “Using simulation to test the robustness of various existing production control policies”, 1991, 1991 Winter Simulation Conference Proceedings, IEEE, p. 261-9.
Berg, R. et al., “The formula: world class manufacturing for hybrid thin-film component production”, 1992, IEEE/SEMI International Semiconductor Manufacturing Science Symposium, pp. 53-60.
Naguib, H., “The implementation of total quality management in a semiconductor manufacturing operation”, 1992, IEEE/SEMI International Semiconductor Manufacturing Science Symposium, p. 63-7.
Rose, D., “Productivity enhancement”, 1992, IEEE/SEMI International Semiconductor Manufacturing Science Symposium, p. 68.
Narayanan, S. et al., “Object-oriented simulation to support operator decision making in semiconductor manufacturing”, 1992, 1992 IEEE International Conference on Systems, Man and Cybernetics, vol. 2, p. 1510-15.
Leonovich, G. A. et al., “Integrated cost and productivity learning in CMOS semiconductor manufacturing”, Jan.-Mar. 1995, IBM Journal of Research and Development, vol. 39 No. 1-2, p. 201-13.
Leonovich, G., “An approach for optimizing WIP/cycle time/output in a semiconductor fabricator”, 1994, Sixteenth IEEE/CPMT International Electronic

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and apparatus for material control system interface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for material control system interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for material control system interface will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4062575

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.