Image analysis – Applications – Manufacturing or product inspection
Patent
1994-06-01
1997-02-11
Mancoso, Joseph
Image analysis
Applications
Manufacturing or product inspection
382218, G06K 900
Patent
active
056029373
ABSTRACT:
An improved machine vision apparatus, of the type having a search element capable of estimating the location of a template image in a candidate image, includes an element that accepts signals representative of the template and of a candidate image. Those signals are applied to the search element to obtain its estimate of location. A correction element responds to the resulting approximation by the location-finder for generating a signal representative of more exacting location based on a known relationship between the location-finder output and more exacting locations of the template in a model of the candidate image.
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Bedrosian David P.
Silver William M.
Cognex Corporation
Del Rosso Gerard
Mancoso Joseph
Powsner David
Weinzimmer Russ
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