4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

David P. Bedrosian

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Displaying lightning strikes

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate

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Displaying lightning strikes

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate

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Displaying lightning strikes

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate

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Methods and apparatus for machine vision high accuracy searching

Image analysis – Applications – Manufacturing or product inspection
Patent

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Methods and apparatus for machine vision template matching of im

Image analysis – Pattern recognition – Template matching
Patent

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Profile ID: LFUS-PAI-P-564703

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