Methods and apparatus for ion beam angle measurement in two...

Radiant energy – With charged particle beam deflection or focussing – With detector

Reexamination Certificate

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C250S492210

Reexamination Certificate

active

11099119

ABSTRACT:
An angle measurement system for an ion beam includes a flag defining first and second features, wherein the second feature has a variable spacing from the first feature, a mechanism to translate the flag along a translation path so that the flag intercepts at least a portion of the ion beam, and a sensing device to detect the ion beam for different flag positions along the translation path and produce a sensor signal having a first signal component representative of the first feature and a second signal component representative of the second feature. The first and second signal components and corresponding positions of the flag are representative of an angle of the ion beam in a direction orthogonal to the translation path. The sensing device may be a two-dimensional array of beam current sensors. The system may provide measurements of horizontal and vertical beam angles while translating the flag in only one direction.

REFERENCES:
patent: 2004/0195528 (2004-10-01), Reece et al.

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